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Vlsi test principles and architecture design for testbility
Material type:
TextPublication details: New Delhi : Elsevier Publication, 1994Description: 777ISBN: - 9789380501550
- 621.392 WAN
| Item type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode | |
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A D Patel Institute of Technology | 621.392 WAN (Browse shelf(Opens below)) | Available | B19 | 02AD22093 |
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| 621.392 UYE Chip design for submicron vlsi | 621.392 VAN Network analysis | 621.392 VAN Network analysis | 621.392 WAN Vlsi test principles and architecture design for testbility | 621.392 WES Principles of cmos vlsi design : a systems perspective | 621.392 WOL Modern vlsi design system on chip design | 621.392 WOL Modern vlsi design system on chip design |
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