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Vlsi test principles and architecture design for testbility (Record no. 39468)

MARC details
000 -LEADER
fixed length control field 00439nam a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 241225s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789380501550
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.392
Item number WAN
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Wang, Laung Terng
245 #0 - TITLE STATEMENT
Title Vlsi test principles and architecture design for testbility
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New Delhi :
Name of publisher, distributor, etc. Elsevier Publication,
Date of publication, distribution, etc. 1994
300 ## - PHYSICAL DESCRIPTION
Extent 777.
365 ## - TRADE PRICE
Price type code 625
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Applied physics
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Wu, Cheng Wen.
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Source of acquisition Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type Public note
        A D Patel Institute of Technology A D Patel Institute of Technology 25/12/2024 Roopal Book Agency, IN506 625.00   621.392 WAN 02AD22093 25/12/2024     B19

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