Normal view MARC view ISBD view

Vlsi test principles and architecture design for testbility

Wang, Laung Terng

Vlsi test principles and architecture design for testbility - New Delhi : Elsevier Publication, 1994 - 777.

ISBN: 9789380501550

Subjects--Topical Terms:
Applied physics

Dewey Class. No.: 621.392 / WAN

Place hold
Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)