000 00407nam a2200145Ia 4500
008 241226s9999 xx 000 0 und d
020 _a81-7227-891-1
082 _a621.317
_bABR
100 _aAbramovici, M
245 0 _aDigital systems testing and testable design
260 _aNew Delhi :
_bJaico Publication,
_c2010.
300 _a652
365 _a495
650 _aElectrical Electronics Communication,
999 _c95317
_d95317