| 000 | 00439nam a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 241225s9999 xx 000 0 und d | ||
| 020 | _a9789380501550 | ||
| 082 |
_a621.392 _bWAN |
||
| 100 | _aWang, Laung Terng | ||
| 245 | 0 | _aVlsi test principles and architecture design for testbility | |
| 260 |
_aNew Delhi : _bElsevier Publication, _c1994 |
||
| 300 | _a777. | ||
| 365 | _a625 | ||
| 650 | _aApplied physics | ||
| 700 | _aWu, Cheng Wen. | ||
| 999 |
_c39468 _d39468 |
||