000 00453nam a2200157Ia 4500
008 241227s9999 xx 000 0 und d
020 _a9780521758338
082 _a621.3821
_bPER
100 _aPerahia, Eldad
245 0 _aNext generation wireless lans: throughput robustness and reliability in 808211 n
260 _aNew York :
_bCambridge Uni,
_c1994
300 _a385.
365 _a495
650 _aApplied physics
700 _aStacey, Robert.
999 _c150130
_d150130