000 00356nam a2200133Ia 4500
008 241225s9999 xx 000 0 und d
020 _a0
082 _a620.11
_bTOL
100 _aTolansky, S.
245 0 _aMultiple beam interfrence microscopy of metals
260 _aLondon :
_bAcademic Press,
_c1970.
365 _a0.00
650 _aPhysical Sciences
999 _c10444
_d10444