Abramovici, M <br/><br/>
Digital systems testing and testable design 

 - New Delhi  :  Jaico Publication,  2010. 
 - 652 
<br/><br/><label>ISBN: </label>81-7227-891-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical Electronics Communication,
<br/><br/><label>Dewey Class. No.: </label>621.317  / ABR