TY  - BOOK
AU  - Wang, Laung Terng
AU  - Wu, Cheng Wen.
TI  - Vlsi test principles and architecture design for testbility
SN  - 9789380501550 
U1  - 621.392 
PY  - 1994///
CY  - New Delhi
PB  - Elsevier Publication
KW  - Applied physics
ER  -