Wang, Laung Terng <br/><br/>
Vlsi test principles and architecture design for testbility 

 - New Delhi :  Elsevier Publication,  1994 
 - 777. 
<br/><br/><label>ISBN: </label>9789380501550  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Applied physics
<br/><br/><label>Dewey Class. No.: </label>621.392  / WAN