Perahia, Eldad <br/><br/>
Next generation wireless lans: throughput robustness and reliability in 808211 n 

 - New York :  Cambridge Uni,  1994 
 - 385. 
<br/><br/><label>ISBN: </label>9780521758338  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Applied physics
<br/><br/><label>Dewey Class. No.: </label>621.3821  / PER