Tolansky, S. <br/><br/>
Multiple beam interfrence microscopy of metals   

 - London :   Academic Press,   1970. 
<br/><br/><label>ISBN: </label>0 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physical Sciences
<br/><br/><label>Dewey Class. No.: </label>620.11  / TOL