Multiple beam interfrence microscopy of metals (Record no. 10444)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00356nam a2200133Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 241225s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.11 |
| Item number | TOL |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Tolansky, S. |
| 245 #0 - TITLE STATEMENT | |
| Title | Multiple beam interfrence microscopy of metals |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | London : |
| Name of publisher, distributor, etc | Academic Press, |
| Date of publication, distribution, etc | 1970. |
| 365 ## - TRADE PRICE | |
| Price type code | 0.00 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Physical Sciences |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Natubhai V Patel College of Pure and Applied Sciences | Natubhai V Patel College of Pure and Applied Sciences | 25/12/2024 | 0.00 | 620.11 TOL | 01NV11676 | 25/12/2024 |