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Next generation wireless lans: throughput robustness and reliability in 808211 n

Perahia, Eldad

Next generation wireless lans: throughput robustness and reliability in 808211 n - New York : Cambridge Uni, 1994 - 385.

ISBN: 9780521758338

Subjects--Topical Terms:
Applied physics

Dewey Class. No.: 621.3821 / PER

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